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IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment

    Buy cheap IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment from wholesalers
     
    Buy cheap IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment from wholesalers
    • Buy cheap IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment from wholesalers
    • Buy cheap IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment from wholesalers
    • Buy cheap IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment from wholesalers

    IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment

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    Brand Name : HongCe
    Model Number : HT-I23
    Certification : Third part calibration certificate(cost additional)
    Price : Negotiatable
    Payment Terms : T/T
    Supply Ability : 100 set/ month
    Delivery Time : 3 Days
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    IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment

    IEC62151 Figure 3 - Test Probe - Length 80mm Diameter 12mm - For Information Technology Equipment


    IEC62151 clause 4.2.2.1 Accessibility
    The equipment shall be so constructed that in USER ACCESS AREAS there is adequate protection against contact with bare parts of TNV - 1 , TNV - 2 and
    TNV - 3 CIRCUITS except that access is permitted to: Test Finger Probe
    – contacts of connectors which cannot be touched by the test probe (figure 3);
    – bare conductive parts in the interior of a battery compartment that complies with 4.2.2.2;
    – bare conductive parts of TNV - 1 CIRCUITS that are connected to a PROTECTIVE EARTHING terminal;
    – bare conductive parts of TNV - 1 CIRCUIT connectors that are separated from unearthed ACCESSIBLE conductive parts of the equipment in accordance with 4.2.1 .2; Test Finger Probe

    Compliance is checked by inspection, by measurement and by means of the test finger (IEC 61032, test probe B) applied as specified in the compliance section of the relevant equipment standard), and the test probe, figure 3.


    Standard:Conforms to IEC60065: 2014 Annex B, IEC62151 figure 3 and UL6500 figure B.1.

    Application:It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.

    Test sample:Information technology equipment.

    Feature:Nylon handle + stainless steel probe. Test Finger Probe

    Parameters:

    ModelHT-I23
    Probe length80 Test Finger Probe
    End radiusR6
    Probe diameterΦ12
    Baffle diameter of the handle50


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